1888 PressRelease - The new TN series of HAR probes from Carbon Design Innovations, Inc. (CDI) are for samples 25nm or taller. TN probe technology is unlike any previous AFM probe in the market. All scanning probe microscope (SPM) and AFM probes of the TN series are made from a proprietary Carbon based composite material with the stability of Silicon but the toughness of Carbon.
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